A fault-accommodation technique proposed for inverter drive systems extends the operation of an electrical power drive during an incipient power transistor fault. The discussed technique utilizes ...

We investigate the operation modes of a dual-gate reconfigurable field-effect transistor (RFET). To this end, dual-gate silicon-nanowire FETs are fabricated based on anisotropic wet etching of silicon ...

System-level test (SLT) has evolved into a necessary test insertion for high-performance processors and chiplets.