If the product requires wafer level testing, then more hardware is needed. In addition to a manual test rig, I will also have been designing a probe card, which will connect to the ATE head with a ...

presents the achievement in 3D/2.5D MEMS probe card development for WAT test (Wafer Acceptance Test, WAT) and provides users the positive effects on test efficiency and reliable results.

Slessor explained that probe-card demand is influenced by new design releases and associated wafer volumes, with low PC and ...

and probe cards. Additionally, the system offers automation options that simplify operations and provide greater flexibility for users. “We believe on-wafer testing systems should be as straight ...

By ensuring that the UltraFLEXplus is compatible with industry-leading optical instrumentation, probers, alignment systems, and probe cards ... for silicon photonics wafer test to meet the ...